X-ray fluorescence
Emission of secondary X-rays from a material excited by high-energy X-rays / From Wikipedia, the free encyclopedia
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X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science, archaeology and art objects[1] such as paintings.[2][3]